Canada tender ยท Advance Contract Award Notice
ACAN 26-58022 Automated Wafer Defect Inspection System and ICP Plasma Processing Module
Reference number: 26-58022
Issuing organization: National Research Council of Canada (NRC)
Published: 2026-06-12
Closing date: 2026-06-29
Tender details
NRC intends to procure highly specialized semiconductor equipment: an automated wafer defect inspection and surface characterization system, plus an ICP plasma processing module for its photonics fabrication centre. The supplier must deliver, install, commission, train users, and support the systems, which must integrate with existing KLA/SPTS Omega fxP equipment. This is effectively a sole-source opportunity unless another supplier can prove full capability.