Dynamic Secondary Ion Mass Spectroscopy Characterization System

Tender details

The Federal Government of Canada seeks a supplier to manufacture, deliver, install, and commission a high-performance Dynamic Secondary Ion Mass Spectrometry (SIMS) system. This advanced system is crucial for characterizing semiconductor materials, ensuring precise sensitivity and depth resolution. The project includes post-installation support, operator training, and a long-term maintenance agreement to maximize instrument uptime. Timely delivery by March 31, 2027, is essential for ongoing research and development in semiconductor technology.