Cryo-Focused Ion Beam (FIB) and scanning electron microscope (SEM)

Tender details

The Federal Government of Canada seeks proposals to install a Cryo-Focused Ion Beam (FIB) and scanning electron microscope (SEM) for the NRC Quantum Nanotechnology Research Centre. This advanced equipment will enhance high-volume etching capabilities, replacing outdated technology and supporting cutting-edge research in quantum nanotechnology. Bidders will provide installation services and ensure integration into the existing microscopy suite, crucial for advancing the Centre's analytical capabilities and innovation in the field.