MERX tender · ACAN - Advance Contract Award Notice (Formal)
ACAN 26-58022 Automated Wafer Defect Inspection System and ICP Plasma Processing Module
Reference number: cb-726-60321147
Issuing organization: National Research Council of Canada (NRC)
Location: National Capital Region
Published: 2026-06-12
Closing date: 2026-06-29
Tender details
Supply and install an automated wafer defect inspection system and an ICP plasma processing module for NRC’s photonics fabrication centre. The equipment must integrate with existing semiconductor tools and support high-precision wafer inspection and etching.